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1
Low-Voltage SOI CMOS VLSI Devices and Circuits
James B. Kuo
,
Shih-Chia Lin
voltage
device
gate
drain
current
devices
cmos
nmos
figure
oxide
shown
threshold
circuit
versus
circuits
shows
technology
effects
adapted
floating
buried
bulk
leakage
frequency
parasitic
transistor
effect
density
temperature
biased
width
bipolar
output
smaller
pmos
dtmos
subthreshold
supply
input
esd
kink
addition
bias
impact
transient
operation
ionization
dynamic
noise
doping
Tahun:
2001
Bahasa:
english
Fail:
PDF, 25.12 MB
Tag anda:
0
/
0
english, 2001
2
Low-Voltage SOI CMOS VLSI Devices and Circuits
Wiley-Interscience
James B. Kuo
,
Shih-Chia Lin
voltage
gate
device
drain
current
so1
devices
cmos
figure
oxide
nmos
shown
circuit
threshold
circuits
technology
versus
adapted
effects
floating
buried
bulk
frequency
parasitic
density
effect
output
bipolar
transistor
pmos
width
shows
supply
dtmos
input
addition
temperature
bias
leakage
showsthe
kink
esd
impact
operation
biased
ionization
transient
dynamic
doping
so1nmos
Tahun:
2001
Bahasa:
english
Fail:
PDF, 51.32 MB
Tag anda:
0
/
0
english, 2001
3
Soft Error Mechanisms, Modeling and Mitigation
Springer International Publishing
Selahattin Sayil (auth.)
delay
crosstalk
victim
error
circuit
aggressor
driver
noise
event
effects
coupling
gate
sizing
voltage
node
effect
current
threshold
output
circuits
critical
induced
pulse
mitigation
technique
method
techniques
waveform
technology
technologies
transistor
modeling
capacitance
transistors
input
shown
particle
simulations
cmos
inverter
dtmos
bias
clock
errors
signal
first
proposed
shows
deposited
radiation
Tahun:
2016
Bahasa:
english
Fail:
PDF, 2.74 MB
Tag anda:
0
/
0
english, 2016
4
Технологические основы производства полупроводниковых интегральных схем: учебное пособие
БГТУ
М. Ф. Жаркой
sio2
intel
si3n4
sih4
gate
sicl4
sihcl3
sih2cl2
euv
ibm
scalpel
2h2
4nh3
c01
core
epic
euvl
hcl
laser
pentium
sicl2
silicon
alxga
amd
c02
dtmos
emission
gaas
mg2si
penryn
probe
resolved
xeon
12h2
1º
2hcl
2mgcl2
3hcl
3sih2cl2
3sih4
4hcl
4nh4ci
5º
6h2
6hcl
afm
al2o3
alteration
arf
assisted
Tahun:
2016
Bahasa:
russian
Fail:
PDF, 1.41 MB
Tag anda:
0
/
0
russian, 2016
1
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